At 6.4% CAGR, the APAC Semiconductor Metrology and Inspection Market is projected to be worth US$ 3,942.04 million by 2028, says Business Market Insights            

According to Business Market Insights’ research, the APAC semiconductor metrology and inspection market was valued at US$ 2,559.95 million in 2022 and is expected to reach US$ 3,942.04 million by 2028, registering an annual growth rate of 6.4% from 2022 to 2028.  Growing manufacturing of semiconductors and increasing use of AI in metrology and inspection systemsare the critical factors attributed to the market expansion.     

Many aspects of the semiconductor manufacturing process, from enhancing the performance of specific equipment to managing an entire fab and optimizing the supply chain, can benefit from artificial intelligence (AI) and machine learning (ML). Measurement and inspection of new, small, and sophisticated 3D structures are difficult for semiconductor producers. The essential capability required for the measurements is provided by optical critical dimension (OCD) metrology. Still, correct findings are dependent on deterministic physical modelling processes, which can be time-consuming and costly. AI and ML are unlikely to replace model-based metrics, but they have complementary strengths, implying that the best solutions will combine them. AI is used in wafer inspection, defect identification and categorization, and scanning electron microscope (SEM) denoising. Advanced correlations between metrology readings and data from industrial sensors are now possible. Engineers can detect hidden signals from these inputs by incorporating AI testing into the semiconductor production process. However, new technology is required to conduct demanding computer vision and other deep neural networks at the edge. Furthermore, the high-performance processors needed to run these AI workloads must be cooled without interfering with the highly sensitive environmental requirements of fabrication facilities. Thus, AI and ML can be expected to play significant role in the future, with regards to advanced semiconductor metrology and inspection devices.

On the contrary, high setup cost of metrology and inspection equipment hurdles the growth of APAC semiconductor metrology and inspection market.

• Based on type, the APAC semiconductor metrology and inspection market is segmented into wafer inspection system, mask inspection system, and thin film metrology. The wafer inspection system segment held 71.5% market share in 2022, amassing US$ 1,830.05 million. It is projected to garner US$ 2,803.69 million by 2028 to expand at 6.3% CAGR during 2022–2028.   
• Based on technology, the APAC semiconductor metrology and inspection market is bifurcated into optical and E-beam. The optical segment held 72.9% market share in 2022, amassing US$   1,866.54 million. It is projected to garner US$ 2,823.08 million by 2028 to expand at 6.1% CAGR during 2022–2028.           
• Based on organization size, the APAC semiconductor metrology and inspection market is bifurcated into large enterprises and SMEs. The large enterprises segment held 73.5% market share in 2022, amassing US$ 1,880.61 million. It is projected to garner US$ 2,926.76 million by 2028 to expand at 6.5% CAGR during 2022–2028.          
• Based on country, the APAC semiconductor metrology and inspection market has been categorized into China, India, Japan, South Korea, Taiwan, and rest of APAC.  Our regional analysis states that China captured 35.3% market share in 2022. It was assessed at US$ 903.86 million in 2022 and is likely to hit US$ 1,410.46 million by 2028, exhibiting a CAGR of 6.6% during the forecast period.           

Key players dominating the APAC semiconductor metrology and inspection market are Applied Materials, Inc.; ASML Holding N.V.; Hitachi High-Tech Corporation; JEOL Ltd; KLA Corporation; Lasertec Corporation; Nikon Metrology NV; Nova Ltd.; Onto Innovation; and Thermo Fisher Scientific Inc. among others.           

• In 2022, Lasertec announced the release of the MATRICS X9ULTRA series, a mask inspection system designed to inspect the photomasks used in extreme ultraviolet (EUV) lithography while their pellicles are not attached.

• In 2022, Hitachi High-Tech Corporation has announced the launch of its "Advanced-Technology Innovation Center Naka (ACN)" in Hitachinaka, Ibaraki Prefecture, as a new demonstration and collaboration base. This facility will serve as a demonstration centre for integrated solution development such as microscopes, as well as a place to start and promote the development of new analytical system products through collaborative activities closer to the company's design and development base.

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